Included with every T°Imager® system, T°Viewer™ enables users to visualize and analyze measurement data produced by the T°Imager® at a personal computer, freeing the main device for constant use and multiplying the number of analysts that can work simultaneously. T°Viewer™ facilitates easy browsing through file directories and straightforward thermal image visualization. The user can perform standard image manipulations (i.e. zoom, pan, smooth, etc.) and superimpose thermal response maps on test device images to localize areas of interest. T°Viewer™ also displays graphical profiles of results along horizontal and vertical cross sections, defined by the user. After completing your analysis, save the data by exporting the thermal images to the Clipboard, the profiles to a spreadsheet, and the 3D data files to other commercial visualization programs.



T°PixelTM processes T°Imager® images in submicron detail to calculate a highly accurate temperature map, even on small device features. Users can load a saved calibration image and activation image to perform detailed reflectivity and temperature change analysis. Automatically align calibration and activation images to increase CTR accuracy, employ pixel-by-pixel refinement tools to reduce uncertainty, focus on regions of interest with statistics-driven image processing, and extract detailed information through image tracing. After analyzing and filtering the data collected by T°Imager®, T°Pixel™ allows the user to export the final results to a spreadsheet, where each cell represents each pixel in the image.

Now, with T°Pixel™, you can take data analytics down to nanometer levels.

The intuitive workflow of T°Pixel™ is divided into four parts:

  • Browsing – The user can browse through measurement files for both activation and calibration. The software provides a summary of measurement information, including date and time, lens type, light wavelength, and pixel resolution, as well as voltage, current, and power for each activation channel.
  • AlignmentT°Pixel™ automatically aligns the acquired fields of activation and calibration in the x, y, and θ directions. In addition, intra-measurement alignment routines utilize measurement frame data to provide a pixel-perfect temperature field.
  • Masking – Statistics-driven masking removes pixels with weak signal-to-noise ratios. Available masking criteria include the standard deviation of the temperature delta field. Furthermore, user-defined regions of interest can be selected for individual examination and comparison.
  • Analysis – The final step displays region value statistics and enables spreadsheet exporting of per-pixel values.